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Wednesday, May 13, 2020 | History

3 edition of Investigation of PTFE transfer films by infrared emission spectroscopy and phase-locked ellipsometry found in the catalog.

Investigation of PTFE transfer films by infrared emission spectroscopy and phase-locked ellipsometry

James L. Lauer

Investigation of PTFE transfer films by infrared emission spectroscopy and phase-locked ellipsometry

by James L. Lauer

  • 191 Want to read
  • 35 Currently reading

Published by National Aeronautics and Space Administration, For sale by the National Technical Information Service in [Washington, D.C.], [Springfield, Va .
Written in English

    Subjects:
  • Infrared spectroscopy.

  • Edition Notes

    StatementJames L. Lauer and Bruce G. Bunting and William R. Jones, Jr.
    SeriesNASA technical memorandum -- 89844.
    ContributionsBunting, Bruce G., Jones, William R., 1940-, United States. National Aeronautics and Space Administration.
    The Physical Object
    FormatMicroform
    Pagination1 v.
    ID Numbers
    Open LibraryOL15282040M


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Investigation of PTFE transfer films by infrared emission spectroscopy and phase-locked ellipsometry by James L. Lauer Download PDF EPUB FB2